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I  am  Peyman Pouyan,  currently a post-doc researcher at  the  department of  Computer Engineering, Technical University of Delft, Netherlands.  I have  received my PhD degree (Cum Laude ) in   electronic engineering  at  Universitat   Politècnica  de  Catalonia, M.Sc. degree  in   System  On  Chip  from  Lund  University   Sweden  and   Bachelor   degree  in Electrical  Engineering in 2015,  2010  and  2007  respectively.  My   main  current research field is Reliability and Test in conventional and emerging memories.




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