Welcome to Peyman Pouyan’s Homepage
I am Peyman Pouyan, currently a post-doc researcher at the department of Computer Engineering, Technical University of Delft, Netherlands. I have received my PhD degree (Cum Laude ) in electronic engineering at Universitat Politècnica de Catalonia, M.Sc. degree in System On Chip from Lund University Sweden and Bachelor degree in Electrical Engineering in 2015, 2010 and 2007 respectively. My main current research field is Reliability and Test in conventional and emerging memories.